SPAD Sensor Characterization and Production

Forza Silicon’s Chief Technology Officer, Daniel Van Blerkom presented “SPAD Image Sensor Characterization and Production Testing” at Image Sensors Auto Europe 2019.

The presentation discussed Forza Silicon’s approach to the evaluation and testing of single-photon avalanche diode (SPAD) based sensors, for both performance and yield analysis. In addition, the talk highlighted the unique considerations in test system development that must be taken in order to track SPAD yield and performance.

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